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Figure 1
Scattering geometry of an FXS experiment. (a) The incident X-ray beam is diffracted from a sample solution (or aerosol) and recorded in the far field on a 2D detector. Here [\rho_\omega] corresponds to the illuminated portion of the dilute sample and [I_\omega] denotes the scattered intensity. (b) Measured diffraction pattern mapped on the Ewald sphere [E_\lambda], where [{\bf q}={\bf k}_{\rm out}-{\bf k}_{\rm in}] is the scattering vector, [{\bf k}_{\rm in}] is the wavevector of the incident X-ray pulse, [{\bf k}_{\rm out}] is the wavevector of the scattered pulse and [|{\bf k}_{\rm in}|=|{\bf k}_{\rm out}|=\kappa].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 2| April 2024| Pages 324-343
https://doi.org/10.1107/S1600576724000992
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