Neural network analysis of neutron and X-ray reflectivity data incorporating prior knowledge

Munteanu, V.; Starostin, V.; Greco, A.; Pithan, L.; Gerlach, A.; Hinderhofer, A.; Kowarik, S.; Schreiber, F.

doi:10.1107/S1600576724002115

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
(a) Two SLD profiles with mirrored derivatives. (b) The derivatives of the two SLD profiles. (c) The corresponding reflectivity curves for the two SLD profiles are almost identical (they would be exactly identical in the kinematic approximation), despite the fact that the SLD profiles in (a) are very dissimilar.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 2| April 2024| Pages 456-469

https://doi.org/10.1107/S1600576724002115

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