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Figure 4
Sample-space projections of simulations of DFXM images for a phantom comprising a wall of edge dislocations in aluminium with 4 µm between the dislocation lines (Fig. 2). The position of the core of the central dislocation is indicated with a red dot. The tilt angle ϕ is varied from 100 (strong beam condition) to 300 µrad (weak beam condition). (a)–(c) Wavefront propagation results, displaying a region of interest of the illuminated sample, with varying tilt angles from 100 to 300 µrad. (d)–(f) Geometrical optics results for direct comparison with panels (a)–(c). All images are normalized to the maximum intensity of the strong beam condition (ϕ = 0).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 2| April 2024| Pages 358-368
https://doi.org/10.1107/S1600576724001183
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