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Figure 3
The sample system (blue box) with axes (s, y, Q) given by coordinates in the grain system. Also shown is the laboratory system (xl, yl, zl), rotated with respect to the sample coordinate system by an angle of θ around the common y axis. A symmetric geometry is defined with diffraction vector Q = [[{\overline 1} 1 {\overline 1}]], (xl, zl) being the scattering plane and the sample surface normal being along [[10{\overline 1}]].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 2| April 2024| Pages 358-368
https://doi.org/10.1107/S1600576724001183
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