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Figure 9
(a) A realization of a JEOL 2010F schematic drawing in the software (Sarney, 2004BB10). (b) A model of a generic SEM schematic drawing in the software (Steff, 2010BB11). The sample in the TEM schematic drawing would be located inside the objective lens but is not indicated on the schematic drawing.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 4| August 2023| Pages 1267-1276
https://doi.org/10.1107/S1600576723005174
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