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Figure 10
Completeness as a function of grain size for measurements of (a) CCD and (b) flat panel detectors. Completeness values are plotted as an average and an error bar for all the LabDCT grains, while only the grain centroid completeness is plotted for SR-DCT grains. These grains are classified into TPs and FNs.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 3| June 2023| Pages 810-824
https://doi.org/10.1107/S1600576723003874
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