Bayesian inference of metal oxide ultrathin film structure based on crystal truncation rod measurements

Anada, M.; Nakanishi-Ohno, Y.; Okada, M.; Kimura, T.; Wakabayashi, Y.

doi:10.1107/S1600576717013292

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 2
Depth dependence of (a) interplanar distance, (b) displacement of the A site and (c) occupancy of (Sr, La) of the LaAlO₃/SrTiO₃ heterostructure model. Error bars represent the standard deviation $[{\sigma}]$ of $[{P(\theta _{i}|{\bf I}^{{\rm VM}}_{{\rm exp}})}]$ . For most of the plots, the $[{\sigma}]$ values are smaller than the symbol size. Shaded areas represent regions having occ(A, n) < 0.5. The differences between the resulting structure $[{\boldTheta}]$ and $[{\boldTheta}^{{\rm VM}}]$ are plotted with the origin shifted to the thick horizontal lines. The difference of $[{z(\alpha,n)}]$ is magnified by a factor of 10.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 6| December 2017| Pages 1611-1616

https://doi.org/10.1107/S1600576717013292

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