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Figure 5
(a) Temperature scans of interface distribution function g(r) recorded during the melting process (3 K min−1) of PTN crystallized at Tc = 383 K. (b) Temperature dependence of the lamellar structures variables L, da, dc, ϕc,lin, Q and first derivative profile of Q (dQ/dT) during the heating process for PTN crystallized at 383 K. The arrows indicate two-step changes in structural parameters.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part s1| February 2007| Pages s637-s641
doi:10.1107/S002188980700461X
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