Wide-q observation from 10−4 to 2.0 Å−1 using a focusing and polarized neutron small-angle scattering spectrometer, SANS-J-II

Iwase, H.; Koizumi, S.; Suzuki, J.; Oku, T.; Sasao, H.; Tanaka, H.; Shimizu, H.M.; Hashimoto, T.

doi:10.1107/S0021889807006280

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 2
Schematic views for (a) conventional pinhole SANS spectrometer (SANS-J) and (b) focusing and polarized neutron ultra-small-angle scattering spectrometer (SANS-J-II) (Koizumi et al., 2006

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 40| Part s1| March 2007| Pages s414-s417

doi:10.1107/S0021889807006280

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