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Figure 3
Raw Pt L3-edge XAFS of Pt/SiO2 obtained under different in situ conditions: (a) 350°C in N2, (b) 350°C 5% H2 in N2, (c) ambient temperature in N2, and (d) ambient temperature in 0.6% CO. For each condition, sample angles of 30°, 35°, 40°, and 45° were measured and plotted with the result of iterative Bragg peak removal (IBR-AIC).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 3| May 2024| Pages 456-463
https://doi.org/10.1107/S1600577524002327
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