view article
Figure 6
Nanoscale morphological and optical analysis of PS-PVAc films. AFM topography (a) and respective synchrotron radiation IR broadband reflectivity (s-SNOM amplitude) at the third (b) and fourth (c) harmonics of the tip frequency. Scale bar represents 500 nm. (d) Near-field (NF) absorption spectra acquired at the blue and red dots indicated in (a). (e) AFM topography revealing fine details of the film's surface structures. Scale bar represents 200 nm. (f) NF absorption spectra (O—C=O stretching band) taken along the line in (e). (g) Spatial-spectral representation of the spectra taken along the line in (e).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 3| May 2024| Pages 547-556
https://doi.org/10.1107/S1600577524002364
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS