Development of the multiplex imaging chamber at PAL-XFEL

Hwang, J.; Kim, S.; Lee, S.Y.; Park, E.; Shin, J.; Lee, J.H.; Kim, M.-; Kim, S.; Park, S.-Y.; Jang, D.; Eom, I.; Kim, S.; Song, C.; Kim, K.S.; Nam, D.

doi:10.1107/S1600577524001218

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Figure 4
(a) Top view of the spectrometer installed in the multiplex imaging chamber. Three components of the von Hamos spectrometer are indicated by arrows: (1) sample stage, (2) an Si crystal analyzer with a radius of curvature of 250 mm mounted on the stacked stages, (3) JUNGFRAU 0.5M. It is located next to the sample stage. The distance between the crystal plane and the detector plane is determined by the radius of curvature of the crystal analyzer. (b) Energy range measured by the spectrometer with Si(111) and Si(220) crystal analyzers. Because of the finite volume of the multiplex imaging chamber, the measurable energy range is restricted.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 3| May 2024| Pages 469-477

https://doi.org/10.1107/S1600577524001218

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