The Extreme Conditions Beamline P02.2 and the Extreme Conditions Science Infrastructure at PETRA III

Liermann, H.-P.; Konôpková, Z.; Morgenroth, W.; Glazyrin, K.; Bednarčik, J.; McBride, E.E.; Petitgirard, S.; Delitz, J.T.; Wendt, M.; Bican, Y.; Ehnes, A.; Schwark, I.; Rothkirch, A.; Tischer, M.; Heuer, J.; Schulte-Schrepping, H.; Kracht, T.; Franz, H.

doi:10.1107/S1600577515005937

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Figure 8
Instrumental resolution function (IRF) measured for a 2 µm × 2 µm KB mirror focused beam collected on an XRD 1621 from PerkinElmer at (a) 25.638 keV and (b) 42.720 keV as a function of sample-to-detector distance (SDD) using the CeO₂ powder diffraction standard from NIST (674b) loosely filled into an empty gasket hole with a thickness of 0.03 mm. (c) Comparison of the IRF determined from the PerkinElmer XRD1621 and the Mar345 image plate as a function of different SDDs for the (200) and (422) reflections at an energy of 42.72 keV.

JOURNAL OF
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ISSN: 1600-5775

Volume 22| Part 4| July 2015| Pages 908-924

https://doi.org/10.1107/S1600577515005937

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