Ray-tracing analytical absorption correction for X-ray crystallography based on tomographic reconstructions

Lu, Y.; Duman, R.; Beilsten-Edmands, J.; Winter, G.; Basham, M.; Evans, G.; Kamps, J.J.A.G.; Orville, A.M.; Kwong, H.-S.; Beis, K.; Armour, W.; Wagner, A.

doi:10.1107/S1600576724002243

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 2
Tomography projection images for background [(a) and (d)], sample [(b) and (e)] and flat-field-corrected images [(c) and (f)] of OmpK36 (top) and Cld samples (bottom).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 3| June 2024|

https://doi.org/10.1107/S1600576724002243

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