view article
Figure 1
Powder X-ray diffraction pattern and Rietveld refinement of NbF5: measured data points (black dots), calculated diffraction pattern (red line), background (green line) and difference curve (gray). The calculated reflection positions are indicated by the vertical bars at the bottom. Rp = 3.08, Rwp = 4.25%, RBragg = 1.32%, S = 1.77.

Journal logoCRYSTALLOGRAPHIC
COMMUNICATIONS
ISSN: 2056-9890
Volume 79| Part 12| December 2023| Pages 1207-1211
https://doi.org/10.1107/S2056989023010150
Follow Acta Cryst. E
Sign up for e-alerts
E-alerts
Follow Acta Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS