Optimal estimated standard uncertainties of reflection intensities for kinematical refinement from 3D electron diffraction data

Khouchen, M.; Klar, P.B.; Chintakindi, H.; Suresh, A.; Palatinus, L.

doi:10.1107/S2053273323005053

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 4
An image of a reflection (−1, −5, −9) from the diffraction pattern of the L-alanine data set of model 3 that is clearly visible, although it has I < 3σ(I) in the correction model 3.

FOUNDATIONS
ADVANCES

ISSN: 2053-2733

Volume 79| Part 5| September 2023| Pages 427-439

https://doi.org/10.1107/S2053273323005053

Open

access

Follow Acta Cryst. A

Search IUCr Journals		doi		Advanced search
Author		volume	page